Description
The Micsig MOIP series is a SigOFIT optical-fiber isolated probe family intended for high-voltage, high-frequency and floating-ground measurements. Micsig’s third-generation platform is designed around optical isolation and advanced probe technology for applications such as power semiconductor testing, SiC/GaN gate-drive measurements and power-electronics development.
Key highlights:
• Optical-fiber isolated measurement
• Designed for high-voltage and high-frequency applications
• Suitable for floating-ground measurements
• High common-mode rejection
• Applicable to SiC and GaN power-device testing
• Designed for power electronics, inverters and advanced R&D measurements





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